Transmittance and reflectance measurement

A possible application for integrating spheres is the measurement of the reflectance and transmittance of diffuse or scattering materials. The measurements are performed photopically or spectrally, as a function of wavelength. The measurement of luminous reflectance or transmittance is performed using a photopic response detector. A transmittance measurement places a material sample at the entrance port to the sphere.

In reflectance measurements, the sample can be placed at a port opening opposite the entrance port. The incident flux is reflected by the sample. The total hemispherical reflectance, both the diffuse and specular components, is collected by the integrating sphere. There are special applications such as ECER46 that also require a specific sphere design.

Integrating Sphere with diffuse and directional light source kms 10
Highly specialized measurement device with two color temperature
regulated (standard illuminant A) light sources